PRECILAB offers complete analytical packages to help in the characterization of ultra-pure and incoming water for the semiconductor industry. We use only the latest in ICP-MS and IC (ion chromatography) to achieve the detection limits needed to ensure the quality and productivity the industry must have to save time and money. Beyond the trace element analysis we also offer high precision analysis for total organic carbon (TOC), bacteria, silicon (colloidal, total and dissolved), pH, conductivity, alkalinity, and hardness. We can provide all the required sampling apparatus and bottles. Flexible and cost saving analytical packages are available to meet any need.
PRECILAB uses state of the art instruments:
- ICP-MS (Single and triple Quadrupole ICP-MS)
- ICP-OES
- IC
- IC-MS
- pH-meter
- EC meter (conductivity)
- TOC meter (low-ppb capable)
- Ultraviolet-visible Spectrophotometer (UV-Vis)
- Liquid Particle Counting
Tests available for ultra-pure water:
PRECILAB offers a complete set of tests, including trace elements with ultra-low detection limits ranging from low ppb to sub-ppb by ICP-OES, to low ppt-ppg by ICP-MS for up to 68 Elements.
- Anions and Cations
- Total Organic Carbon (TOC)
- Bacteria (Colony Forming Units / L)
- Silicon (Colloidal, Total, Dissolved)
- Total Silicon by ICP-OES
- pH
- Alkalinity, Hardness
- Conductivity
- Liquid Particle Counting
- and other tests upon request.
Flexible cost saving analytical packages available:
Premium Package | Standard Package |
---|---|
67 Trace Elements [ICPMS] | 36 Trace Elements [ICPMS] |
Anions | Anions |
Cations | Ammonium (NH4+) |
Silicon Colloidal | Silicon Colloidal |
Silicon Dissolved | |
TOC | TOC |
Alkalinity | |
Hardness | |
Bacteria | Bacteria |
Total Silicon [ICP-OES] | Total Silicon [ICP-OES] |